Line x tester analysis for yield and yield traits in wheat (SKNAU)

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dc.contributor.authorJain, S K
dc.date.accessioned2019-10-14T07:21:06Z
dc.date.available2019-10-14T07:21:06Z
dc.date.issued2000
dc.identifier.urihttp://krishikosh.egranth.ac.in/handle/1/5810131016
dc.keywordsWHEATen_US
dc.language.isoenen_US
dc.publisherSKNAUen_US
dc.subGenetics and Plant Breedingen_US
dc.subjectnullen_US
dc.themeWHEATen_US
dc.these.typeM.Scen_US
dc.titleLine x tester analysis for yield and yield traits in wheat (SKNAU)en_US
dc.typeThesisen_US
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