Studies on genetic gain In grain yield through peduncle length and flag leaf area in wheat (T. aeslivum L. em. Theil )

dc.contributor.advisorYadava, R. K
dc.contributor.authorSatyavart
dc.date.accessioned2018-10-09T09:36:15Z
dc.date.available2018-10-09T09:36:15Z
dc.date.issued1997
dc.identifier.urihttp://krishikosh.egranth.ac.in/handle/1/5810077848
dc.keywordsGenetic gain
dc.language.isoEnglish
dc.pages95p.
dc.publisherCollege of Agriculture Chaudhary Charan Singh Haryana Agricultural University Hisar
dc.subGenetics
dc.these.typeM.Sc
dc.titleStudies on genetic gain In grain yield through peduncle length and flag leaf area in wheat (T. aeslivum L. em. Theil )
dc.typeThesis
Files
Original bundle
Now showing 1 - 2 of 2
Loading...
Thumbnail Image
Name:
231841.pdf
Size:
30.06 MB
Format:
Adobe Portable Document Format
Loading...
Thumbnail Image
Name:
231841_abstract.pdf
Size:
917.44 KB
Format:
Adobe Portable Document Format
Collections