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    Effect of corn syrup impurity on dielectric properties and electrical conductivity of honey
    (Punjab Agricultural University, Ludhiana, 2021) Kehal, Kamaldeep Singh; Paramjit Singh
    The present work has been done to evaluate the effect of adulteration of corn syrup on dielectric properties and electrical conductivity of honey. Honey was adulterated at five different concentrations (10%, 20%, 30%, 40% and 50%). All the measurements were taken at ten different frequencies (10, 20, 30, 40, 50, 60, 70, 80, 90 and 100 kHz) and five different temperatures (30º, 40º, 50º, 60º and 70º C). In addition to these parameters, density and viscosity were also determined at different temperatures. Dielectric constant decreased linearly with the increase in temperature, frequency and adulteration. Loss tangent increased linearly with increase in temperature and decreased exponentially with increase in frequency. Electrical conductivity increased linearly with the increase in temperature and frequency. Both loss tangent and electrical conductivity increased linearly with adulteration. Density decreased linearly with the increase in temperature and adulteration. Viscosity decreased exponentially with the increase in temperature and decreased linearly with the increase in adulteration. The data obtained were statistically analyzed using one-way analysis of variance at 5% level of significance. These parameters were found to vary significantly with adulteration. The constants and coefficients of these parameters-corn syrup relationships for honey were obtained. The regression equations developed relating dielectric constant, loss tangent, electrical conductivity, density and viscosity had high correlation coefficient (R2 > 0.898).