G. ShanthakumarKiran K.K.2021-07-152021-07-152016-07https://krishikosh.egranth.ac.in/handle/1/5810170547An investigation was carried out to screen 36 maize inbred lines against turcicum leaf blight under artificial epiphytotic condition during kharif 2014 at the Main Agricultural Research Station, UAS, Dharwad. Ten inbred lines showed resistant reaction, of which inbred lines viz., DMIT 105, DMIT 113 and DMIT 118 exhibited lowest terminal per cent disease index and area under disease progress curve which can be considered as slow blighters. Nine inbred lines viz., DMIT 105, DMIT 106, DMIT 111, DMIT 113, DMIT 118, DMIT 121, DMIT 123, DMIT 124 and DMIT 125 based on resistance against turcicum leaf blight, per se performance were selected and crossed to develop 36 single crosses following half diallel mating design. The combining ability analysis revealed presence of higher magnitude of SCA variance than GCA variance indicating predominance of non-additive gene action for most of the traits except kernel rows per cob. The parents DMIT 123 and DMIT 125 were found best for most of yield and its contributing traits as they showed significant gca effects. The crosses, DMIT 105 × DMIT 121, DMIT 118 × DMIT 124, DMIT 121 × DMIT 125 and DMIT 123 × DMIT 125 were found best specific combinations for grain yield with highest sca effects and were found resistant to turcicum leaf blight. The generation mean analysis in the cross DMIT 126 × DMIT 136 indicated duplicate gene action for plant height, kernel rows per cob, kernels per cob, cob weight per plant, hundred grain weight, shelling percentage and grain yield per plant. Single marker analysis in F2 population of the cross DMIT 126 × DMIT 136 revealed Phi 330507 and Umc 1221 markers were closely linked to turcicum leaf blight resistant gene and accounted for 13.77 and 22.72 % of the total variance with LOD of 8.01 and 13.94, respectively.EnglishThesis