Yadav, Neelam R.Amandeep Kaur2016-09-172016-09-172014http://krishikosh.egranth.ac.in/handle/1/77229Cluster bean (Cyamopsis tetragonoloba) is an important member of Leguminoseae family and is a rich source of galctomannan content making it an industrial crop. In this crop, there are almost no genomic resources or high quality co-dominant markers available for genetic analysis. At present there is no report of SSR markers targeting bacterial leaf blight resistance available for this crop but available EST database was used to develop EST-SSRs. Cluster bean EST sequences (16476) were retrieved and used to identify EST-SSRs using SSRIT tool. A total of 858 SSRs were identified with maximum proportion of trinucleotide repeats and least proportion of pentanucleotide repeats. CT/TC motif was most abundant. Eighty sequences related to pathogen stress response were identified out of which 17 SSRs were used for in silico primer designing. Twenty seven genotypes were selected for molecular marker analysis using these 11 EST-SSRs. Plants were also grown in net house for studying disease incidence. Two wild speices, C. senegelensis (18.55 ± 1.86 %) and C. serrata (16.30 ± 0.93 %) showed lowest disease incidence, while highest disease incidence was observed in case of Pusa Nav Bahar (73.23 ± 0.92 %). All the 11 EST-SSR markers were polymorphic in molecular analysis, showing different allele sizes in wild and cultivated genotypes. Diversity analysis suggested that two wild species formed a different group at a similarity coefficient of 0.75 including some of the cultivated genotypes. Four genotypes, C. senegelensis, HG 563, HG 75 and PNB, were selected for sequencing and multiple sequence alignment against HES 1401. The alignment suggested the presence of SNPs and In/ Dels in the sequencesenCluster bean, ESTs, EST-SSRs, bacterial leaf blight, C. senegelensis, C. serrata, PNB, disease incidence.Molecular marker analysis for bacterial blight resistance in cluster bean (Cyamopsis tetragonoloba (L.) Taub.)Thesis