Development of Relationship between Remotely Sensed Data at Different Crop Growth Stages and Yield Monitor Data for Maize Crop
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Date
2016
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Punjab Agricultural University, Ludhiana
Abstract
The average yield of maize in India is only 2.47 tonnes/ha as against the global average of 5.47
tonnes/ha. To meet the food grain requirement of 480 million tonnes by the year 2050 in India, with the
increasing challenges of biotic-abiotic stresses experienced by crops, introduction and adoption of
modern technologies in Indian agriculture is inevitable. Precision farming is one of the technology
which helps to find these goals. Monitoring of crop growth and forecasting its yield well before harvest
is very important for better crop and food management. Hence, the study has been carried out to
develop the empirical relationship between remotely sensed data at different crop growth stages and
yield data for maize crop. Spectroradiometer, infrared camera, N-Tester and chlorophyll content meter
(CCM) were used to collect data at different growth stages of the crop to develop relationship with the
yield monitor data. The near infrared (NIR) camera was mounted on parrot AR. Drone 2.0 frame for
image acquisition. Maize field was harvested by the combine harvester mounted with yield monitor to
generate the yield map of the field. The average yield of the field recorded by yield monitor was 3913.9
kg/ha with standard deviation of 390.12 kg/ha and coefficient of variation of 9.33 %. The data revealed
that the grid size has non-significant effect on yield and error at 5 % level of significance. Statistical
linear regression models were used to develop empirical relationship between the sensor data and yield
at three growth stages of maize crop. The yield prediction equations have maximum coefficient of
determination (R²) i.e. 0.90, 0.84, 0.86 for NDVI (R630-690 and R760-900), N-Tester and NDVI (NIR
camera) respectively at silking stage (R1). While for CCI, the maximum coefficient of determination
i.e. 0.87 was observed at dough stage (R4). All sensor values like NDVI, CCI and N-tester values were
positively correlated with yield data at all growth stages of maize. The data revealed a close linear
relationship between NDVI (NIR camera) and NDVI (R630-690 and R760-900) with coefficient of
determination (R2) value 0.80. Similarly there was a close relationship between CCI and N-tester
values with coefficient of determination (R2) 0.79. It was concluded that the silking stage (R1 stage) i.e.
55 DAP was the most prominent stage for yield prediction using NDVI. Yield can be predicted 48 days
before harvesting using reflectance data captured by spectroradiometer.
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