Identification of molecular markers for Karnal bunt resistance in wheat (Triticum aestivum L. em. Thell)

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dc.contributor.advisorRedhu, A.S.
dc.contributor.authorPriyanka
dc.date.accessioned2017-06-03T04:06:48Z
dc.date.available2017-06-03T04:06:48Z
dc.date.issued2014
dc.description.abstractPresent study was carried out to screen 104 recombinant inbred lines (RILs) of cross H 567.71 (resistant) x WH 542 (susceptible) for Karnal bunt resistance and to identify SRAP and RGAP markers associated with Karnal bunt resistance in wheat. There was significant variation among all the recombinant inbred lines for percentage and coefficient of infection to Karnal bunt. Most of the RILs (68) and (71) showed up to 5% infection during the year 2011-12 and 2012-13 and thus were resistant. The percentage of infected grains or percent infection (PI) in the susceptible RILs was up to 37.14 % in the year 2011-12 and up to 31.57 % in the year 2012-13 respectively, whereas, range of coefficient of infection (CI) in the RILs was 0 to 14.21 % in the year 2011-12 and 0 to 13.81 % in the year 2012-13, respectively. Significant variations were also observed for different morphological traits such as, plant height (cm), days to flowering, days to maturity, number of tillers/meter length, spike length (cm), no. of grains/spike, 1000 grain weight, grain yield/meter length (g) and biological yield (g). A total of 80 SRAP and 121 RGAP primer combinations were used to screen parental genotypes. In SRAP, a total of 287 unambiguous bands were amplified by the 20 SRAP of 80 SRAP primer combinations, of which 123 bands were polymorphic (42.85 %). The cluster analysis led to distribution of parents and their RILs in to two major groups at the similarity coefficient value of 0.55. Major cluster I, included resistant parent H 567.71 with resistant lines and major cluster II had susceptible parent WH 542 and susceptible lines, these two groups further subdivided at similarity coefficient of 0.67 into four different clusters. In RGAP, a total of 89 unambiguous bands were amplified by the 9 of 121 RGAP primer combinations, of which 46 bands were polymorphic (51.68 %). Genetic similarity by RGAP analysis showed that parental genotypes were quite distinct from each other. The cluster analysis led to distribution of parents and their RILs in to two groups at the similarity coefficient value of 0.42. Major cluster I, included resistant parent H 567.71 with resistant lines and major cluster II had susceptible parent WH 542 and susceptible lines. These two groups further subdivided into six different clusters at similarity coefficient of 0.56. By single marker analysis, RGAP 7, RGAP 8 and RGAP 9 were directly linked with resistance genes which provide resistance against Karnal bunt. Hence, selection of Karnal bunt resistant genotypes on the basis of these three markers in early generations can be done through marker assisted selection and could be useful in future development of Karnal bunt resistant varieties.en_US
dc.identifier.urihttp://krishikosh.egranth.ac.in/handle/1/5810014726
dc.language.isoenen_US
dc.publisherCCSHAUen_US
dc.subGenetics and Plant Breeding
dc.subjectdiseases, wheats, grain, developmental stages, genetics, biological phenomena, yields, genotypes, planting, polymorphismen_US
dc.these.typePh.D
dc.titleIdentification of molecular markers for Karnal bunt resistance in wheat (Triticum aestivum L. em. Thell)en_US
dc.typeThesisen_US
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